Improved Measurement System and Method
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United States of America Patent
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Issued Date -
Dec 9, 2010
app pub date -
Jan 23, 2009
filing date -
Jan 25, 2008
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Abandoned
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Abstract
The invention concerns a measurement system and method for optical spectroscopic measurement of samples. The system comprises an illumination source for forming a primary light beam, a first tunable monochromator for spectrally filtering the primary light beam, a sample-receiving zone to which the spectrally filtered primary beam is directed for producing a secondary light beam affected by a sample in the sample receiving zone, and a second tunable monochromator for spectrally filtering the secondary light beam, and a detector for measuring the intensity of the spectrally filtered secondary beam. In particular, the system is adapted to scan a predefined wavelength range using one of the monochromators and to tune the other monochromator sequentially to one of at least two predefined separate wavelengths in order to eliminate the effect of undesired diffraction orders of the second monochromator on the measurement. The invention allows for eliminating the use of optical diffraction order filters on the emission side of a fluorescence measurement system.
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