LINEAR ION TRAP FOR MSMS
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United States of America Patent
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Issued Date -
Dec 2, 2010
app pub date -
May 27, 2010
filing date -
May 27, 2009
priority date (Note) -
Abandoned
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Abstract
A method and apparatus for acquiring time profiles of ion intensities of product ions in a mass spectrometer is provided. The mass spectrometer comprises an ion trap, a fragmentation module connected to the ion trap, and a mass analyzer module positioned to receive ions from the fragmentation module. Precursor ions, trapped in the ion trap, are ejected from the ion trap in order of m/z ratio. At least of some the precursor ions are fragmented at the fragmentation module to form product ions. Time profiles of ion intensities of the product ions are acquired, the product ions received at the mass analyzer module, by recording a plurality of product mass spectra for each respective precursor ion. The plurality of product mass spectra is processed, using the time profile intensities, to associate respective product ions with the respective precursor ions.
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