SIGNAL ANALYSIS METHOD, SIGNAL ANALYSIS DEVICE AND SIGNAL ANALYSIS PROGRAM

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United States of America Patent

APP PUB NO 20100274511A1
SERIAL NO

12733812

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Abstract

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Provided is a signal analysis device that has a high frequency resolution not depending on an analysis window length and can analyze a frequency with considerably high accuracy. When the signal analysis device inputs therein an analysis object signal to be analyzed, the device obtains a frequency f′, amplitude A′ and an initial phase φ′ such that the sum of squares of a difference between the analysis object signal and a sinusoidal model signal expressed by a phase using the frequency f′ and the initial phase φ′ and by the amplitude A′ is a minimum value.

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Patent Owner(s)

Patent OwnerAddress
NATIONAL UNIVERSITY CORPORATION UNIVERSITY OF TOYAMA3190 GOFUKU TOYAMA-SHI TOYAMA 9308555 ?9308555

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Hirobayashi, Shigeki Toyama, JP 1 7

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