PHOTOVOLTAIC DEVICES INSPECTION APPARATUS AND METHOD OF DETERMINING DEFECTS IN PHOTOVOLTAIC DEVICES
Number of patents in Portfolio can not be more than 2000
United States of America Patent
Stats
-
N/A
Issued Date -
Oct 21, 2010
app pub date -
Dec 19, 2008
filing date -
Dec 28, 2007
priority date (Note) -
Abandoned
status (Latency Note)
Importance
Abstract
A photovoltaic devices inspection apparatus and a method of determining defects in photovoltaic devices using electroluminescence of the photovoltaic devices. The apparatus and method can not only determine whether the photovoltaic devices are defective or non-defective at the moment, but also whether the devices have a possibility to become defective in the future.A constant electric current is applied to the photovoltaic cells to cause electroluminescence (S7), the light emitted from each cell is photographed cell by cell (S10), and the photographed cell image is enhanced and a shape of a dark region is analyzed (S50) to determine whether the cell is defective or non-defective. The defective region that is determined to be defective is enhanced and displayed visually (S16).
First Claim
Family
International Classification(s)
Cited Art Landscape
Patent Citation Ranking
Recipient Email Address
Recipient Email Address
Comment
Recipient Email Address
Add to Portfolio(s)
To add this patent to one, or more, of your portfolios, simply click the add button.
This Patent is in these Portfolios:
Add to additional portfolios:
Last Refreshed On:
Changes done successfully