METHOD FOR FORMING SILICON DOTS

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United States of America Patent

APP PUB NO 20100260944A1
SERIAL NO

12739982

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ATTORNEY / AGENT: (SPONSORED)

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Abstract

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A method for forming silicon dots which can form silicon dots at a relatively low temperature, with good controllability of the particle diameter of silicon dots depending on the particle diameter of silicon dots to be formed.The method for forming silicon dots comprises producing inductively coupled plasma from a gas for forming silicon dots provided within the plasma producing chamber by applying a high-frequency power to an antenna with reduced inductance placed within the plasma producing chamber to form silicon dots on a substrate S disposed within the chamber in the presence of the inductively coupled plasma. Conditions for a pretreatment of the substrate prior to the formation of silicon dots, the temperature of the substrate in forming silicon dots and the gas pressure in the plasma producing chamber during the formation of silicon dots are controlled depending on the particle diameter of the silicon dots.

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Patent Owner(s)

Patent OwnerAddress
NISSIN ELECTRIC CO LTDKYOTO PREFECTURE KYOTO BEIJING BEIJING TIANJIN TIANJIN MU TING 47 TIMES KYOTO-SHI KYOTO

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Kaki, Hirokazu Kyoto, JP 3 11
Takahashi, Eiji Kyoto, JP 267 2627
Tomyo, Atsushi Osaka, JP 15 73

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