Tip-sharpened carbon nanotubes and electron source using thereof

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United States of America Patent

APP PUB NO 20100258724A1
SERIAL NO

11645601

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Abstract

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An electron microscope comprising an electron emitting cathode equipped with a carbon nanotube and an extraction unit to field-emit electrons. The carbon nanotube contains a sharp portion which is approximately conical shape at tip thereof closed at the electron-emitting cathode.A method of manufacturing carbon nanotube having a sharp angle part at the tip thereof, comprising a step of placing and heat-treating a tip-sharpened carbon nanotube still at a lower temperature than a phase transition temperature and a step of placing and heat-treating a tip-sharpened carbon nanotube still at a higher temperature than a phase transition temperature.

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Patent Owner(s)

Patent OwnerAddress
HITACHI HIGH-TECHNOLOGIES CORPORATION24-14 NISHI-SHIMBASHI 1-CHOME MINATO-KU TOKYO

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Fujieda, Tadashi Mito, JP 59 568
Hayashibara, Mitsuo Hitachinaka, JP 36 369
Hidaka, Kishio Hitachiota, JP 44 535

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