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United States of America Patent

SERIAL NO

12818563

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ATTORNEY / AGENT: (SPONSORED)

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Abstract

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The present invention relates to a probe for testing of integrated circuits or other microelectronic devices.

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Patent Owner(s)

Patent OwnerAddress
CASCADE MICROTECH INC14255 S W BRIGADOON CT SUITE C BEAVERTON OREGON 97005

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Andrews, Mike Hillsboro, US 61 1625
Hayden, Leonard Beaverton, US 26 488
Martin, John Portland, US 232 6499

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