EMBEDDED TEST SYSTEM AND METHOD
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United States of America Patent
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Issued Date -
Sep 16, 2010
app pub date -
Jun 20, 2008
filing date -
Jun 26, 2007
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Abandoned
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Abstract
An embedded test system is provided where asynchronous communications links are used to pass the boundary scan information by the use of a network router to a boundary scan adapter (54, 60) associated with each component to be tested. This approach enables the system components themselves to facilitate the implementation of a chain-free boundary scan architecture as opposed to a traditional boundary scan bridge approach thus reducing component count and simplifying system design. Thus boundary scan tests can still be performed even after one or more components have been disabled, configured in functional mode or have failed. The same commanding sequence can be applied irrespective of the network topology or the component count since the routing of the boundary scan information is the responsibility of the network routing functionality. This testing method is independent of the underlying functionality of the target hardware or its individual components. The invention also provides for a hybrid solution to adapt boundary scan compatible COTS components so that they can be used within a chainless boundary scan architecture.
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