SIGNAL PROCESSING AND TIME DELAY MEASUREMENT

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United States of America Patent

APP PUB NO 20100231437A1
SERIAL NO

12083977

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Abstract

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Two versions of a binary signal having an irregular sequence of states are processed by deriving (i) a first value which represents the average time derivative of one signal at the times of transitions in the other signal, and (ii) a correlation value for the two signals, and then combining the first value with the correlation value. For a given relative delay introduced between the signals, the resultant combined value indicates whether the introduced delay brings the transitions in the two signals into coincidence. The process can be repeated for other introduced delays to determine the amount of delay between the two signals.

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Patent Owner(s)

Patent OwnerAddress
MITSUBISHI ELECTRIC CORPORATION7-3 MARUNOUCHI 2-CHOME CHIYODA-KU TOKYO 1008310 ?1008310

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Szajnowski, Wieslaw Jerzy Guildford, GB 36 759

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