SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREOF

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United States of America Patent

APP PUB NO 20100200853A1
SERIAL NO

12687939

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Abstract

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A method for manufacturing a semiconductor device includes: (a) performing an inspection using an evaluation element formed on a scribe line of a semiconductor wafer; (b) marking a character on the semiconductor wafer, the character representing information based on a result obtained in step (a); and (c) performing a step subsequent to step (b) while using the information represented by the character marked in step (b).

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Patent Owner(s)

Patent OwnerAddress
SEIKO EPSON CORPORATIONSHINJUKU-KU TOKYO-TO

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
MISAWA, Hideki Sakata, JP 5 12

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