STITCH QUALITY MONITORING SYSTEM
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United States of America Patent
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Issued Date -
Jul 29, 2010
app pub date -
Jan 27, 2010
filing date -
Jan 27, 2009
priority date (Note) -
Abandoned
status (Latency Note)
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Abstract
A stitcher is provided that includes a needle configured to place stitches in a fabric that is moved therethrough. The stitcher includes a sensor positioned below the fabric to monitor stitches placed in the fabric. A microcontroller is provided configured to receive data from the sensor and, based on such data, to compare one or more attributes of the monitored stitches with one or more predetermined parameters relating at least one attribute of the fabric. The predetermined parameter may be either hardcoded inn the microcontroller or input by a user of the stitcher prior to beginning operation of the machine. When the attributes of the monitored stitches fall outside of the predetermined parameters, the microcontroller initiates notification of the user.
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