METHOD FOR PREDICTING AN IMPACT OF AN AGING BEHAVIOUR OF AN ELECTRICAL ELEMENT AND SIMULATION MODEL FOR SIMULATING SUCH BEHAVIOUR
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United States of America Patent
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Issued Date -
Jul 8, 2010
app pub date -
Apr 19, 2007
filing date -
Apr 19, 2006
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Abandoned
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Abstract
A method is provided for predicting an impact of an aging behavior of a connector element, which simulates degradation states caused by aging of the connector element by means of at least one resistor element and a voltage source, as well as a computer program performing the method, a computer readable medium including the computer program, and a simulation model for simulating a degraded connector element.
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