HIGH RELIABILITY Au ALLOY BONDING WIRE AND SEMICONDUCTOR DEVICE OF SAME

Number of patents in Portfolio can not be more than 2000

United States of America Patent

SERIAL NO

12297263

Stats

ATTORNEY / AGENT: (SPONSORED)

Importance

Loading Importance Indicators... loading....

Abstract

See full text

[Issues to be Solved] Providing enhanced bonding reliability of Au alloy bonding wire with low electrical resistivity to Al electrode of semiconductor device, and its application of semiconductor device is bonded with Al electrode pad by the same wire.[Solution Means] Au alloy bonding wire comprising: 0.02-0.3 mass % Ag, total amount of 10-200 mass ppm at least one element of Ge and/or Si, and/or total amount of 10-200 mass ppm at least one element of Al and/or Cu, with residual of Au. Moreover, Al and/or Al alloy pad bonded with the above Au alloy bonding wire.

Loading the Abstract Image... loading....

First Claim

See full text

Family

Loading Family data... loading....

Patent Owner(s)

Patent OwnerAddress
TANAKA DENSHI KOGYO K K2303-15 YOSHIDA YOSHINOGARI-CHO KANZAKI-GUN SAGA 842-0031

International Classification(s)

Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Amada, Fujio Kanzaki-gun, JP 3 7
Chiba, Jun Kanzaki-gun, JP 23 277
Murai, Hiroshi Kanzaki-gun, JP 16 76

Cited Art Landscape

Load Citation

Patent Citation Ranking

Forward Cite Landscape

Load Citation