RASTER NEAR FIELD MICROSCOPY IN THE MICROWAVE AND TERAHERTZ RANGES WITH A SIGNAL PROCESSING DEVICE INTERGRATED IN THE MEASURING TIP
Number of patents in Portfolio can not be more than 2000
United States of America Patent
Stats
-
N/A
Issued Date -
Jul 1, 2010
app pub date -
Mar 16, 2005
filing date -
Mar 9, 2005
priority date (Note) -
Abandoned
status (Latency Note)
Importance
Abstract
An imaging microwave probe (1) with at least one measuring tip (5) on a measuring arm (2), whereby at least one of the measuring lips (5) has an antenna (6) for the detection or emission of electromagnetic signals and the measuring tip is significantly smaller in the near field than the wavelength of the electromagnetic signals, a positioning device for positioning of an object (3) for measuring relative to the measuring tip (5) in at least one spatial dimension (X, Y, Z), with a signal processing device (7) in electrical connection to the antenna (6) for conversion of the sensor signal from the antenna to a measured signal with a reduced frequency suitable for analysis or for conversion of a coupling signal with reduced frequency into a signal for transmission from the antenna (6) are described. The signal processing device (7) is integrated on the measuring tip (5) adjacent to the antenna (6) and a measured/coupling signal path (8) for the measured and/or coupling signal running from the signal processing device (7) to a measuring unit (9) arranged at a separation from the measuring tip at a frequency selected such that the measured and/or coupling signal is provided in the measuring region without significant distortion.
First Claim
Family
International Classification(s)
Cited Art Landscape
Patent Citation Ranking
Recipient Email Address
Recipient Email Address
Comment
Recipient Email Address
Add to Portfolio(s)
To add this patent to one, or more, of your portfolios, simply click the add button.
This Patent is in these Portfolios:
Add to additional portfolios:
Last Refreshed On:
Changes done successfully