TEST STRIP AND DEVICE FOR MEASURING SAMPLE PROPERTIES AND SYSTEM INCORPORATING THE SAME
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United States of America Patent
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N/A
Issued Date -
Jun 24, 2010
app pub date -
Feb 11, 2009
filing date -
Dec 24, 2008
priority date (Note) -
Abandoned
status (Latency Note)
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Abstract
A test strip for use in measuring sample properties, a device for use with the test strip, and a system incorporating the same. The test strip includes a sample receiving portion and a plurality of electrodes extending along an electrode plane and intersecting with the sample receiving portion. The test strip also includes a contact plane oriented orthogonal to the electrode plane and including a plurality of planar contacts adapted to conductively interface with the meter's connector when urged against the connector in a direction normal to the contact plane. The contacts encode information pertaining to characteristics of the test strip. The contacts may be sized and spaced in order to encode the information. Also, the contacts may be insulated in order to encode the information.
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