METHOD OF FORMING LOW-K FILM HAVING CHEMICAL RESISTANCE

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United States of America Patent

APP PUB NO 20100151151A1
SERIAL NO

12333186

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Abstract

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A method of forming a low-k film containing silicon and carbon on a substrate by plasma CVD, includes: supplying gas of a precursor having a Si—R—O—R—Si bond into a reaction space in which a substrate is placed; and exciting the gas in the reaction space, thereby depositing a film on the substrate.

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ASM JAPAN K K23-1 6-CHOME NAGAYAMA TAMA-SHI TOKYO 206-0025

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Kawaguchi, Ryo Tokyo, JP 11 46
Matsushita, Kiyohiro Tokyo, JP 20 8697
Nakano, Akinori Tokyo, JP 16 4324
Nonaka, Yuya Kawasaki-shi, JP 6 2058

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