METHOD AND APPARATUS FOR DELAY FAULT COVERAGE ENHANCEMENT

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United States of America Patent

APP PUB NO 20100138709A1
SERIAL NO

12554437

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Abstract

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A hybrid clocking scheme for simultaneously detecting a b-cycle path-delay fault in a b-cycle (false) path and a c-cycle path-delay fault in a c-cycle (false) path using at least n+1 at-speed clock pulses during a capture operation in a clock domain in a scan design or a scan-based BIST design, where 1<=b<=c<=n. The scan design or BIST design includes multiple scan chains, each scan chain comprising multiple scan cells coupled in series. The design includes one or more clock domains each running at its intended operating frequency or at-speed. The hybrid clocking scheme comprises at least one at-speed shift clock pulse or one at-speed capture clock pulse immediately followed by at least two at-speed capture clock pulses during the capture operation to simultaneously detect the b-cycle path-delay fault and the c-cycle path-delay fault within the clock domain.

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Patent Owner(s)

Patent OwnerAddress
SYNTEST TECHNOLOGIES INC505 S PASTORIA AVENUE SUITE 101 SUNNYVALE CA 94086-7583(USA)

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Chao, Hao-Jan Taoyuan City, TW 11 181
Hsiao, Michael S Blacksburg, US 8 129
Jiang, Zhigang Burlingame, US 21 218
WANG, Laung-Terng Sunnyvale, US 47 628
Wu, Shianling Prineston Sunotion, US 21 350
Yan, Jianping Miepitas, US 8 38

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