SYSTEM FOR ANALYZING A SAMPLE OR A SAMPLE COMPONENT AND METHOD FOR MAKING AND USING SAME
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United States of America Patent
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Issued Date -
May 13, 2010
app pub date -
Nov 13, 2008
filing date -
Nov 13, 2008
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Abandoned
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Abstract
A system and associated method are disclosed for analyzing a sample or sample component including species capable of producing fluorescent light when excited by a light source, where the light source comprises an excimer light source having a high voltage power supply with voltage and current regulation circuitry.
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