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Abstract

An improvement in sampling a high frequency input analog signal and converting it to a digital output signal is disclosed. This is accomplished by using a multitude of analog-to-digital converters in conjunction with a distributed sampling system. This combination of multiple converters and a distributed sampling system allows use of conventional device processing, such as that of 0.18 micron silicon, and also provides accurate sampling of very high frequency input signals. The distributed sampling system provides multiple samplings of the input signal by using multiple ADCs for multiple samplings, wherein each sampling is sequentially offset a fixed amount of time from the most recent preceding sampling. Each ADC has a designated central processing unit (CPU) to obtain sufficient data transfer capabilities. The samplings from the multitude of ADCs are a series of sequential digital output values. The digital output values could be the result of samplings all at the same frequency, or at different frequencies. Types of distributed sampling systems include a multitude of elongated trace patterns interconnected in series, a multitude of inverter pairs interconnected in series, a specific permittivity material device, and a sequencer or multiplier. A second enhanced sampling system includes a variable sized aperture window, wherein a width of a sample pulse is narrowed through a variable clock mechanism to produce a faster sampling rate. This variable sized aperture window system can be used by itself, or in combination with any of the presently described multiple ADC distributed sampling systems.

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First Claim