Apparatus and method for electrochemically depositing metal on a semiconductor workpiece

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United States of America Patent

APP PUB NO 20100116671A1
SERIAL NO

11543270

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Abstract

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A process for metallization of a workpiece, such as a semiconductor workpiece. In an embodiment, an alkaline electrolytic copper bath is used to electroplate copper onto a seed layer, electroplate copper directly onto a barrier layer material, or enhance an ultra-thin copper seed layer which has been deposited on the barrier layer using a deposition process such as PVD. The resulting copper layer provides an excellent conformal copper coating that fills trenches, vias, and other microstructures in the workpiece. When used for seed layer enhancement, the resulting copper seed layer provide an excellent conformal copper coating that allows the microstructures to be filled with a copper layer having good uniformity using electrochemical deposition techniques. Further, copper layers that are electroplated in the disclosed manner exhibit low sheet resistance and are readily annealed at low temperatures.

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SEMITOOL INCMONTANA

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Chen, Linlin Plano, US 58 1810
McHugh, Paul R Kalispell, US 119 1734
Ritzdorf, Thomas L Bigfork, US 67 1228
Weaver, Robert A Kalispell, US 32 1199
Wilson, Gregory J Kalispell, US 146 1759

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