Spectral Measuring System
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United States of America Patent
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Issued Date -
Mar 25, 2010
app pub date -
Jan 28, 2008
filing date -
Feb 2, 2007
priority date (Note) -
Abandoned
status (Latency Note)
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Abstract
A spectral measuring system for determining substance properties using terahertz radiation comprises: one or more radiation sources of which at least one radiation source is adjustable or configurable with regard to its wavelength, wherein the first radiation source emits first radiation at a predetermined first wavelength; and is characterised by a sensor which responds to further radiation which is based on the radiation of the at least one radiation source; a control unit which is connected to the at least one radiation source and the sensor; wherein the control unit is configured to trigger at least one radiation source and to adjust the wavelength of the at least one adjustable radiation source as well as to read out the sensor.
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