ARRAY SUBSTRATE AND DEFECT-DETECTING METHOD THEREOF
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United States of America Patent
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Issued Date -
Mar 18, 2010
app pub date -
Dec 22, 2008
filing date -
Sep 12, 2008
priority date (Note) -
Abandoned
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Abstract
The present invention discloses an array substrate and a defect detecting method thereof. The array substrate comprises one or more shorting bars for applying signals to a plurality of data lines or a plurality of gate lines of the array substrate while testing. The array substrate further comprises a line detecting circuit for receiving signals on the plurality of data lines or the plurality of gate lines, and detecting and locating the line defects of the plurality of data lines or the plurality of gate lines. The array substrate and the defect detecting method thereof provided by the invention can locate the line defects of the array substrate accurately and quickly.
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