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Country	kind	publication No.	Filing Date	Type	Sub-Type
EP	B1	EP2163911	Sep 16, 2008	Patent	Grant
Type : Patent Sub-Type : Grant
Patent		Verfahren zum Testen einer Schutzvorrichtung sowie entsprechend ausgestaltete Schutzvorrichtung und Testvorrichtung		Jan 26, 2011

• 15 United States
• 10 France
• 8 Japan
• 7 China
• 5 Korea
• 2 Other

Patent Owner(s)

Patent Owner	Address
OMICRON ELECTRONICS GMBH	OBERES RIED 1 KLAUS 6833

International Classification(s)

• G01R:MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC V....
• H02H:EMERGENCY PROTECTIVE CIRCUIT ARRANGEMENTS

• 2009 Application Filing Year
• G01R Class
• 3380 Applications Filed
• 2204 Patents Issued To-Date
• 65.21 % Issued To-Date

Inventor(s)

Inventor Name	Address	# of filed Patents	Total Citations
Klapper, Ulrich	Rankweil, AT	27	101
# of filed Patents : 27 Total Citations : 101

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Patent Citation Ranking

• 1 Citation Count
• G01R Class

• 3.56 % this patent is cited more than
• 15 Age

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Maintenance Fees

Fee	Large entity fee	small entity fee	micro entity fee	due date

Fee	Large entity fee	small entity fee	micro entity fee
Surcharge after expiration - Late payment is unavoidable	$700.00	$350.00	$175.00
Surcharge after expiration - Late payment is unintentional	$1,640.00	$820.00	$410.00

Full Text

US Patent Application No: 2010/0066,376

METHOD FOR TESTING A PROTECTIVE DEVICE, A PROTECTIVE DEVICE, AND TEST DEVICE

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Abstract

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A method for testing a protective device as well as a correspondingly configured protective device and test device are provided.

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Description

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Claims

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