CONTROLLED ATOMIC FORCE MICROSCOPE
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United States of America Patent
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Issued Date -
Mar 11, 2010
app pub date -
May 23, 2007
filing date -
May 24, 2006
priority date (Note) -
Abandoned
status (Latency Note)
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Abstract
The invention relates to an atomic force microscope including a microtip placed on a flexible support connected to a microscope head facing a surface to be studied, which includes means for controlling the distance between the head and the surface for a given value and means for inhibiting vibration of the microtip.
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