System for Electrical Apparatus Testing
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United States of America Patent
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Issued Date -
Mar 11, 2010
app pub date -
Sep 5, 2008
filing date -
Sep 5, 2008
priority date (Note) -
Abandoned
status (Latency Note)
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Abstract
An easily implemented method of diagnosing both supply path, upstream, and load path, downstream, anomalies such as impedance events in machine or motor circuitry is accomplished by analyzing the across-the-line startup current and voltage time waveforms. No line of sight limitations exist and high accuracy exists. The techniques can be automated estimating poor contact resistance based on the voltage and current variation under a load change condition perhaps such as startup and/or shutdown of the load. Both, upstream and downstream problems from the point of voltage measurement can be monitored analyzing a load change condition. Additionally, downstream problems can be identified by using negative sequence current under steady state operation of the load.
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