Positive resist composition and method of forming resist pattern

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United States of America Patent

PATENT NO 8338075
APP PUB NO 20100047724A1
SERIAL NO

12534735

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Abstract

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A positive resist composition including: a base component (A) which exhibits increased solubility in an alkali developing solution under the action of acid; and an acid-generator component (B) which generates acid upon exposure; dissolved in an organic solvent (S), the organic solvent (S) including an alcohol-based organic solvent having a boiling point of at least 150° C.; and a method of forming a resist pattern including: applying the positive resist composition on a substrate on which a first resist pattern is formed to form a second resist film; and subjecting the second resist film to selective exposure and alkali developing to form a resist pattern.

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Patent Owner(s)

Patent OwnerAddress
TOKYO OHKA KOGYO CO LTD150 NAKAMARUKO NAKAHARA-KU KAWASAKI-SHI KANAGAWA 211-0012

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Iwai, Takeshi Kawasaki, JP 75 842
Kumada, Shinji Kawasaki, JP 7 14
Nakamura, Tsuyoshi Kawasaki, JP 257 1982
Takeshita, Masaru Kawasaki, JP 49 380
Yoshii, Yasuhiro Kawasaki, JP 25 179

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