PROBE FOR SCANNING PROBE MICROSCOPE

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United States of America Patent

APP PUB NO 20100043108A1
SERIAL NO

12262208

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ATTORNEY / AGENT: (SPONSORED)

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Abstract

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In a tip having a carbon nanotube tip used to a scanning probe microscope, its length of the tip is adjusted in a several order of 10 nm and the tip maintains cylindrical shape up to the extremity portion.

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Patent Owner(s)

Patent OwnerAddress
HITACHI CONSTRUCTION MACHINERY CO LTDTOKYO
HITACHI KYOWA ENGINEERING CO LTDIBARAKI

International Classification(s)

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Hirooka, Motoyuki Hitachi, JP 16 213
Morimoto, Takafumi Abiko, JP 22 370
Okai, Makoto Tokorozawa, JP 54 950
Sekino, Satoshi Ushiku, JP 21 124
Takashina, Masato Mito, JP 2 12
Tanaka, Hiroki Takahagi, JP 403 2433
Uozumi, Yuuki Hitachinaka, JP 1 2

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