Method and system for perpendicular magnetic media metrology

United States of America Patent

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Issued Date
Jan 7, 2010
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May 11, 2006
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May 11, 2006

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Abandoned

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Abstract

A metrology system for measuring the magnetic properties of a magnetic recording medium layer on a device used for perpendicular recording.

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Patent Owner	Address
MICROSENSE LLC	1 VAN DE GRAAFF DRIVE BURLINGTON MA 01890

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G11B:INFORMATION STORAGE BASED ON RELATIVE MOVEMENT BET....

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Inventor Name	Address	# of filed Patents	Total Citations
Van, Drent William	Somerville, US	6	14

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Method and system for perpendicular magnetic media metrology

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United States of America Patent

11432730

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11432730

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