POLISHING COMPOSITION FOR SILICON WAFER, POLISHING COMPOSITION KIT FOR SILICON WAFER AND METHOD OF POLISHING SILICON WAFER

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United States of America Patent

APP PUB NO 20090317974A1
SERIAL NO

12282969

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Abstract

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The present invention provides a polishing composition which can remove a natural oxidized layer on a silicon wafer and can efficiently polish the silicon wafer. The polishing composition of the present invention comprises colloidal ceria and an alkaline polishing composition. The polishing composition of the present invention may further comprise a chelating agent. The present invention includes a polishing method comprising removing an oxidized layer with colloidal ceria; a polishing method comprising removing an oxidized layer with colloidal ceria and polishing a silicon wafer with an alkaline polishing composition; and a polishing method comprising polishing a silicon wafer with a polishing composition comprising colloidal ceria and an alkaline polishing composition. Further, the present invention relates to a polishing composition kit comprising colloidal ceria and an alkaline polishing composition.

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Patent Owner(s)

Patent OwnerAddress
DUPONT AIRPRODUCTS NANOMATERIALS LIMITED LIABILITY COMPANY2441 WEST ERIE DRIVE TEMPE AS 85282

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Iwata, Naoyuki Tokyo , JP 31 123
Nagashima, Isao Tochigi-ken , JP 6 62

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