METHODS AND SYSTEMS FOR BINNING DEFECTS DETECTED ON A SPECIMEN
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United States of America Patent
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app pub date -
Aug 3, 2009
filing date -
Dec 14, 2005
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Abandoned
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Abstract
Methods and systems for binning defects detected on a specimen are provided. One method includes comparing a test image to reference images. The test image includes an image of one or more patterned features formed on the specimen proximate to a defect detected on the specimen. The reference images include images of one or more patterned features associated with different regions of interest within a device being formed on the specimen. If the one or more patterned features of the test image match the one or more patterned features of one of the reference images, the method includes assigning the defect to a bin corresponding to the region of interest associated with the reference image.
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