Artifact reduction system and method for radiological imaging system
Number of patents in Portfolio can not be more than 2000
United States of America Patent
Stats
-
Jan 19, 2010
Grant Date -
Nov 26, 2009
app pub date -
May 21, 2008
filing date -
May 21, 2008
priority date (Note) -
In Force
status (Latency Note)
Importance
Abstract
The effects of electromagnetic interference (EMI) on X-ray image data is corrected by characterizing the EMI and processing the image data to subtract the EMI effects from the image data. The X-ray image data, along with offset data, are collected in a conventional manner, affected by EMI if present, and EMI-characterizing data is immediately collected thereafter by disabling rows of a digital detector (FET off). The EMI-characterizing data, then, is not affected by the presence of image data, and can be used to characterize the amplitude and frequency of the EMI. The EMI-characterizing data is assured of being in phase with the collected image and offset data due to its collection in the same image acquisition sequence immediately following the collection of image and offset data. Artifacts due to the presence of EMI are thus eliminated from reconstructed images based upon the corrected data.
First Claim
Family
International Classification(s)
Cited Art Landscape
Patent Citation Ranking
Recipient Email Address
Recipient Email Address
Comment
Recipient Email Address
Add to Portfolio(s)
To add this patent to one, or more, of your portfolios, simply click the add button.
This Patent is in these Portfolios:
Add to additional portfolios:
Last Refreshed On:
Changes done successfully