TEST PROBE
Number of patents in Portfolio can not be more than 2000
United States of America Patent
Stats
-
N/A
Issued Date -
Nov 26, 2009
app pub date -
Jan 23, 2009
filing date -
May 20, 2008
priority date (Note) -
Abandoned
status (Latency Note)
Importance
Abstract
A test probe pin is disclosed. The test probe has a plurality of probes, each of which has a probe tip surface coated with a nano-film of conducting polymer, and the thickness of the nano-film is about 1-20 nm. The probes coated with the nano-film are installed on a test fixture for testing IC components, so that the probes can efficiently provide excellent no-clean property and stabler electro-conductivity for lowering the cleaning frequency of the probes, enhancing the yield of IC component testing, increasing the utility rate of the test fixture, reducing the total testing cost, elongating the usage lifetime of the test probe, and reducing the cost of probe material. Thus, due to the nano-film of conducting polymer, the probes made of metal material can provide almost the same electro-conductivity as a traditional probe by only plating a gold layer of one fifth of original thickness, so that the cost of whole probe material can be reduced.
First Claim
Family
International Classification(s)
Cited Art Landscape
Patent Citation Ranking
Recipient Email Address
Recipient Email Address
Comment
Recipient Email Address
Add to Portfolio(s)
To add this patent to one, or more, of your portfolios, simply click the add button.
This Patent is in these Portfolios:
Add to additional portfolios:
Last Refreshed On:
Changes done successfully