Method for Producing a Tubular Semifinished Product From Fluorine-Doped Quartz Glass
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United States of America Patent
Stats
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N/A
Issued Date -
Oct 22, 2009
app pub date -
Jun 26, 2007
filing date -
Jul 7, 2006
priority date (Note) -
Abandoned
status (Latency Note)
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Abstract
particles by means of plasma burners and in the presence of fluorine, and depositing said particles in layers on the cylindrical outer surface of the substrate tube rotating about its longitudinal axis with formation of a mother tube consisting of fluorine-doped quartz glass; and (c) elongating the mother tube in an elongation process to obtain the tubular semifinished product.
First Claim
all claims..Other Claims data not available
Family
Country | kind | publication No. | Filing Date | Type | Sub-Type |
---|---|---|---|---|---|
DE | B4 | DE102006031898 | Jul 07, 2006 | Patent | Grant |
Type : Patent Sub-Type : Grant | |||||
PATENT (SECOND PUBLICATION) | Verfahren zur Herstellung eines rohrförmigen Halbzeugs aus fluordotiertem Quarzglas | Sep 10, 2009 | |||
WO | A1 | WO2008003613 | Jun 26, 2007 | Patent | Application |
Type : Patent Sub-Type : Application | |||||
INTERNATIONAL APPLICATION PUBLISHED WITH INTERNATIONAL SEARCH REPORT | METHOD FOR PRODUCING A TUBULAR SEMIFINISHED PRODUCT FROM FLUORINE-DOPED QUARTZ GLASS | Jan 10, 2008 |
- 15 United States
- 10 France
- 8 Japan
- 7 China
- 5 Korea
- 2 Other
Patent Owner(s)
Patent Owner | Address | |
---|---|---|
HERAEUS QUARZGLAS GMBH & CO KG | HANAU |
International Classification(s)

- 2007 Application Filing Year
- C03B Class
- 263 Applications Filed
- 146 Patents Issued To-Date
- 55.52 % Issued To-Date
Inventor(s)
Inventor Name | Address | # of filed Patents | Total Citations |
---|---|---|---|
Braeuer, Karsten | Bruchkoebel , DE | 11 | 41 |
# of filed Patents : 11 Total Citations : 41 | |||
Schoetz, Gerhard | Aschaffenburg , DE | 11 | 56 |
# of filed Patents : 11 Total Citations : 56 |
Cited Art Landscape
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Patent Citation Ranking
- 3 Citation Count
- C03B Class
- 8.09 % this patent is cited more than
- 16 Age
Forward Cite Landscape
- No Forward Cites to Display

Maintenance Fees
Fee | Large entity fee | small entity fee | micro entity fee | due date |
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Fee | Large entity fee | small entity fee | micro entity fee |
---|---|---|---|
Surcharge after expiration - Late payment is unavoidable | $700.00 | $350.00 | $175.00 |
Surcharge after expiration - Late payment is unintentional | $1,640.00 | $820.00 | $410.00 |
Full Text
- measuring the following parameters of the MOSFET: number of stacked nanowires/nanosheets Nw,width Ww,i, of the nanowire/nanosheet number i, i being an integer from 1 to Nw,thickness of the nanowire/nanosheet Hw,i, number i, i being an integer from 1 to Nw,corner radius Rw,i of the nanowire/nanosheet number i, i being an integer from 1 to Nw, Rw,i; calculating, using a processor and the measured parameters, a surface potential x normalized by a thermal voltage ΦT given by ΦT=kBT/q;measuring the total gate capacitance for a plurality of gate voltages;determining, using the measured total gate capacitance and the calculated normalized surface potential, the intrinsic parameter of the stacked nanowires/nanosheets MOSFET.

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