DOUBLE EXPOSURE LITHOGRAPHY USING LOW TEMPERATURE OXIDE AND UV CURE PROCESS

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United States of America Patent

APP PUB NO 20090253078A1
SERIAL NO

12415690

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ATTORNEY / AGENT: (SPONSORED)

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Abstract

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A method of processing a substrate includes forming a first layer having a photosensitive response to incident radiation on the substrate, forming a first pattern in the first layer, and exposing the first pattern to ultra-violet radiation. The exposure of the first pattern to ultra-violet radiation increases the resistance of the first pattern to a developer. The method also includes forming a conformal protective layer over the first pattern and at least a portion of the substrate. The method further includes forming a second layer having a photosensitive response to incident radiation over the conformal protective layer and forming a second pattern in the second layer.

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Patent Owner(s)

Patent OwnerAddress
SOKUDO CO LTDKYOTO CITY KYOTO PREFECTURE JAPAN

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Bekiaris, Nikolaos Santa Clara , US 31 427
Cervera, Hiram San Jose , US 2 4
Dai, Junyan Santa Clara , US 4 56
Forstner, Hali Janine Lana Belmont , US 1 4

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