Semiconductor device

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United States of America Patent

SERIAL NO

12320913

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Abstract

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An n-type embedded layer is formed in an N-LV region of a SRAM cell region after an element isolation insulating film is formed on a p-type Si substrate. Thereafter, a p-well and an n-well are formed. In formation of a channel-doped layer, ion implantation is also performed into the N-LV region of the SRAM cell region in parallel with ion implantation into an N-LV of a logic circuit region. Ion-implantation is further performed into the N-LV region of the SRAM cell region in parallel with ion implantation into an N-MV of an I/O region.

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Patent Owner(s)

Patent OwnerAddress
FUJITSU MICROELECTRONICS LIMITEDKANAGAWA 222-0033

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Anezaki, Toru Kawasaki , JP 48 885
Ema, Taiji Kawasaki , JP 186 2365
Kojima, Hideyuki Kawasaki , JP 59 926
Tsutsumi, Tomohiko Kawasaki , JP 15 126

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