PROBE OF VERTICAL PROBE CARD
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United States of America Patent
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Issued Date -
Aug 27, 2009
app pub date -
Jul 22, 2008
filing date -
Feb 21, 2008
priority date (Note) -
Abandoned
status (Latency Note)
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Abstract
A probe of a vertical probe card is disclosed. The probe has a probe tip and a surface region extended from the probe tip about 1-10 mil. The surface region is coated with a nano-film of high electro-conductive nano-material, and the thickness of the nano-film is about 1-20 nm. The nano-film of the probe can efficiently provide excellent no-clean property and higher electro-conductivity for lowering contact force and elongating usage lifetime of the probe of vertical probe card. Accordingly the yield of wafer testing can be improved, the frequency of cleaning probe can be lowered, and the total testing cost can be reduced.
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