Method and system for swipe sensor image alignment using fourier phase analysis
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United States of America Patent
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Issued Date -
Jul 9, 2009
app pub date -
Jan 9, 2008
filing date -
Jan 9, 2008
priority date (Note) -
Abandoned
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Abstract
Provided is a method for analyzing image slices. The method includes transforming a first slice and a second slice to frequency domain and determining shift data between the first slice and the second slice from only the phase component of the transformed first and second slices.
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