Dual mode measurement system with quartz crystal microbalance
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United States of America Patent
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Oct 19, 2010
Grant Date -
Jul 2, 2009
app pub date -
Apr 23, 2008
filing date -
Dec 28, 2007
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Abstract
A dual mode measurement system with quartz crystal microbalance (QCM) is provided, which includes a quartz sensing component, a first measurement circuit, a second measurement circuit and a switch unit. When the first measurement circuit is selected through the switch unit, the first measurement circuit and the quartz sensing component form an oscillation circuit and output a resonance signal. When the second measurement circuit is selected through the switch unit, the second measurement circuit outputs a frequency scanning signal to scan the quartz sensing component, so as to output an impedance sensing signal.
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