APPARATUS FOR SELECTED MEASUREMENT OF, IN PARTICULAR LUMINESCENT AND/OR FLUORESCENT RADIATION
Number of patents in Portfolio can not be more than 2000
United States of America Patent
Stats
-
N/A
Issued Date -
Jun 25, 2009
app pub date -
Dec 22, 2008
filing date -
Dec 21, 2007
priority date (Note) -
Abandoned
status (Latency Note)
Importance
Abstract
An apparatus for selected measurement of at least one of luminescent and fluorescent radiation from at least one sample well, the apparatus comprising: means defining an excitation light path for fluorescence measurements; at least one light source in the excitation path; means defining an emission light path; and at least one detector with a wavelength selector in the emission light path, wherein: the apparatus further comprises at least one first reflector element that encompasses a reflection chamber and projects at least a portion of the light emitted from the at least one sample well directionally onto the wavelength selector; the emission light path extends between the at least one sample well and the wavelength selector through the at least one first reflector element; and the excitation light path extends into the reflection chamber and extends to a point above the at least one sample well.
First Claim
Family
International Classification(s)
Cited Art Landscape
Patent Citation Ranking
Recipient Email Address
Recipient Email Address
Comment
Recipient Email Address
Add to Portfolio(s)
To add this patent to one, or more, of your portfolios, simply click the add button.
This Patent is in these Portfolios:
Add to additional portfolios:
Last Refreshed On:
Changes done successfully