System and method for electronic testing of devices
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United States of America Patent
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Issued Date -
May 28, 2009
app pub date -
Nov 28, 2007
filing date -
Nov 28, 2007
priority date (Note) -
Abandoned
status (Latency Note)
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Abstract
A coupler and associated method electronically tests devices. The method comprises receiving a stimulus signal for testing the electronic device, receiving an aggressor signal, injecting the aggressor signal into the stimulus signal to create a resultant signal that is the stimulus signal having a jitter, and sending the resultant signal to the electronic device. The coupler comprises an input port to receive a stimulus signal for testing the electronic device, an injection device to inject an aggressor signal into the stimulus signal to create a resultant signal that is the stimulus signal having a jitter, and an output port to output the resultant signal to the electronic device.
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