TEST METHOD AND DEVICE FOR TESTING A PLURALITY OF RFID INTERPOSERS
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United States of America Patent
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Issued Date -
May 28, 2009
app pub date -
Apr 5, 2007
filing date -
Apr 12, 2006
priority date (Note) -
Abandoned
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Abstract
Method for testing a large number of RFID interposers in order to check their functionality by means of a test device (9a-9c, 10, 12). Each interposer includes at least one RFID chip (6) and at least two enlarged connection surfaces (7a, 7b) which are arranged on an interposer substrate (8) and are connected to the RFID chip (6). A capacitive coupling for transmitting data is set up between the test device (9a-9c, 10, 12) and at least one of the interposers.
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