METHOD FOR ANALYZING CIRCUIT
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United States of America Patent
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Issued Date -
May 14, 2009
app pub date -
Nov 7, 2008
filing date -
Nov 8, 2007
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Abandoned
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Abstract
A method for analyzing circuit comprises the steps of selecting a plurality of elements; sampling the selected elements, resulting in a plurality of sampling-parameter sets; simulating the sampling-parameter sets to generate a plurality of simulation-results, and process the regression operation for the sampling-parameter sets and simulation-results in order to acquire the contribution rank of each sampling-parameter set and element. Accordingly, while analyzing similar circuits, the partial elements can be selected according to the contribution rank and further sampled; thereby, the amount of sampling-parameter sets can be advantageously reduced, and the analysis efficiency can be improved according to the circuit.
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