X-ray fluorescence spectrometer
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United States of America Patent
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May 24, 2011
Grant Date -
May 7, 2009
app pub date -
Nov 24, 2006
filing date -
Apr 11, 2006
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Abstract
An X-ray fluorescence spectrometer for measuring the concentration of sulfur contained in a sample (S), by irradiating the sample (S) with primary X-rays from an X-ray tube (11), monochromating fluorescent X-rays emitted from the sample (S) with a spectroscopic device, and detecting monochromated fluorescent X-rays with an X-ray detector. The spectrometer includes the X-ray tube (11) having a target with an element including chromium, an X-ray filter (13) disposed on a path of travel of X-rays between the X-ray tube (11) and the sample (S) and having a predetermined transmittance for Cr--K.alpha. line from the X-ray tube (11) and made of a material which is an element of which absorption edges do not exist between energies of S--K.alpha. line and Cr--K.alpha. line, and a proportional counter (18) having a detector gas containing a neon gas or a helium gas.
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