INSPECTION SYSTEM, INSPECTION METHOD, CT APPARATUS AND DETECTION DEVICE
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United States of America Patent
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Issued Date -
Apr 30, 2009
app pub date -
Oct 20, 2008
filing date -
Oct 30, 2007
priority date (Note) -
Abandoned
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Abstract
An inspection system is disclosed. The system comprises a CT apparatus. The CT apparatus includes a gantry, a radiation source connected with the gantry, a detection device connected with the gantry substantially opposite the radiation source, and a transfer device for transferring an object under inspection. The detection device comprises N rows of detectors arranged at predetermined intervals, where N is an integer greater than 1. With the inspection system according to the present invention, the CT apparatus can perform scanning imaging at a high rate to enable the CT apparatus and an scanning imaging device for obtaining a two-dimensional image of an object under inspection to simultaneously operate, thereby compensating each other's insufficiency.
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