PROBE TIP INCLUDING A FLEXIBLE CIRCUIT BOARD
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United States of America Patent
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N/A
Issued Date -
Apr 2, 2009
app pub date -
Sep 30, 2008
filing date -
Oct 1, 2007
priority date (Note) -
Abandoned
status (Latency Note)
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Abstract
A probe tip for attaching to a device to be tested includes a flexible circuit board, at least one contact pad arranged to be able to be attached to at least one contact of a probe tip connector, at least one electrical component having first and second ends, and at least one test pad arranged to be able to be attached to the device to be tested. The at least one contact pad is connected to the first end of the at least one electrical component, and the at least one test pad is connected to the second end of the at least one electrical component. Each of the electrical components of the probe tip is connected to at least one contact pad and is connected to at least one test pad.
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