METHOD AND SYSTEM FOR THE VISUAL CLASSIFICATION OF DEFECTS
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United States of America Patent
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app pub date -
Nov 25, 2008
filing date -
Jan 24, 2007
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Abandoned
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Abstract
A method and system for the classifying of defects in a device is disclosed. The method and system comprises directly classifying samples based upon a feature space; and creating knowledge from the samples of a feature group within the feature space for a supervised classifier. Finally, the method and system includes selecting features to create a best feature group from the feature space for a particular classification of defects. A visual classifier in accordance with the present invention is utilized in three different ways to improve speed and accuracy of the classification. First, the visual classifier directly classifies data. Second, the visual classifier can help to create knowledge about the defects quickly and correctly. Third, a feature selection process is also performed by the visual classifier in accordance with the present invention.
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