MULTI-BEAM ION MOBILITY TIME-OF-FLIGHT MASS SPECTROMETER WITH BIPOLAR ION EXTRACTION AND ZWITTERION DETECTION
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United States of America Patent
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Issued Date -
Mar 19, 2009
app pub date -
Sep 8, 2008
filing date -
May 27, 2005
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Abandoned
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Abstract
The present invention relates generally to instrumentation and methodology for the characterization of chemical samples in solutions or on a surface which is based on modified ionization methods with or without adjustable pH and controllable H-D exchange in solution, an improved ion mobility spectrometer (IMS), a multi-beam ion pre-selection of the initial flow, and coordinated mobility and mass ion separation and detection using a single or several independent time-of-flight mass spectrometers for different beams with methods for fragmenting ion mobility-separated ions and multi-channel data recording
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