LOCK-IN DEMODULATION TECHNIQUE FOR OPTICAL INTERROGATION OF A GRATING SENSOR
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United States of America Patent
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Issued Date -
Mar 5, 2009
app pub date -
Aug 29, 2008
filing date -
Sep 5, 2007
priority date (Note) -
Abandoned
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Abstract
A grating sensor and method for optical interrogation of that sensor uses a lock-in technique to achieve simultaneous measurements of strain (and related temperature) and ultrasonic stress wave signals, as well as other environmental conditions that affect a reflection spectrum of the grating sensor. It achieves this by using a lock-in amplifier or a software demodulator to detect slight shifts in the grating reflection spectrum with high sensitivity and accuracy. A dynamic feedback loop based on the lock-in error signal output retunes the light wavelength of the light source (e.g., a tunable laser) or of a wavelength filter in the reflection path to maintain it relative to a specified reflection point of the grating reflector. The lock-in error signal serves as a measure of temperature/strain changes and of ultrasonic vibrations.
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