Pattern forming method, resist composition to be used in the pattern forming method, negative developing solution to be used in the pattern forming method and rinsing solution for negative development to be used in the pattern forming method

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United States of America Patent

PATENT NO 8034547
APP PUB NO 20090011366A1
SERIAL NO

12145151

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Abstract

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A pattern forming method includes (a) coating a substrate with a resist composition including a resin that includes a repeating unit represented by a following general formula (NGH-1), and, by the action of an acid, increases the polarity and decreases the solubility in a negative developing solution; (b) exposing; and (d) developing with a negative developing solution:represents a hydroxyl group.

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Patent Owner(s)

Patent OwnerAddress
FUJIFILM CORPORATION26-30 NISHIAZABU 2-CHOME MINATO-KU TOKYO 106-8620

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Hoshino, Wataru Minami-Ashigara, JP 68 560
Mizutani, Kazuyoshi Shizuoka, JP 85 963
Tarutani, Shinji Shizuoka, JP 46 817
Tsubaki, Hideaki Shizuoka, JP 101 2182
Wada, Kenji Shizuoka, JP 117 1931

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