PROBE FOR ELECTRICAL TEST
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United States of America Patent
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N/A
Issued Date -
Jan 8, 2009
app pub date -
Jul 2, 2007
filing date -
Jul 2, 2007
priority date (Note) -
Abandoned
status (Latency Note)
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Abstract
A probe for electrical test comprises an arm region extending in a first direction, and a tip region leading to one side in a second direction intersecting the first direction of the arm region, and has a plate form making a direction interesting the first and second directions a thickness direction. The tip region includes a pedestal portion leading to the arm region and a contact portion leading to the pedestal portion, and the contact portion includes a base portion forming a part of the pedestal portion and a projecting portion leading to the base portion and projecting from the pedestal portion in the second direction. By this, damage to the contact portion is prevented.
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